A comparison of methods for the evaluation of binary measurement systems

Wessel N. van Wieringen*, Edwin R. van den Heuvel

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate.

Original languageEnglish
Pages (from-to)495-507
Number of pages13
JournalQuality engineering
Volume17
Issue number4
DOIs
Publication statusPublished - 1 Oct 2005

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