ADJUSTING MEASUREMENT BIAS IN SEQUENTIAL MIXED-MODE SURVEYS USING RE-INTERVIEW DATA

Thomas Klausch, Barry Schouten, Bart Buelens, Jan Van Den Brakel

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)409-432
JournalJOURNAL OF SURVEY STATISTICS AND METHODOLOGY
Volume5
Issue number4
DOIs
Publication statusPublished - Dec 2017

Cite this