Effects of Reusing Baseline Volumes of Interest by Applying (Non-)Rigid Image Registration on Positron Emission Tomography Response Assessments

F.H.P. van Velden, I.A. Nissen, W. Hayes, L.M. Velasquez, O.S. Hoekstra, R. Boellaard

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Article numbere87167
JournalPLoS ONE
Volume9
Issue number1
DOIs
Publication statusPublished - 2014

Cite this

@article{e0f00b0f41ef4157b1579aa2696e4681,
title = "Effects of Reusing Baseline Volumes of Interest by Applying (Non-)Rigid Image Registration on Positron Emission Tomography Response Assessments",
author = "{van Velden}, F.H.P. and I.A. Nissen and W. Hayes and L.M. Velasquez and O.S. Hoekstra and R. Boellaard",
year = "2014",
doi = "10.1371/journal.pone.0087167",
language = "Undefined/Unknown",
volume = "9",
journal = "PLoS ONE",
issn = "1932-6203",
publisher = "Public Library of Science",
number = "1",

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Effects of Reusing Baseline Volumes of Interest by Applying (Non-)Rigid Image Registration on Positron Emission Tomography Response Assessments. / van Velden, F.H.P.; Nissen, I.A.; Hayes, W.; Velasquez, L.M.; Hoekstra, O.S.; Boellaard, R.

In: PLoS ONE, Vol. 9, No. 1, e87167, 2014.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Effects of Reusing Baseline Volumes of Interest by Applying (Non-)Rigid Image Registration on Positron Emission Tomography Response Assessments

AU - van Velden, F.H.P.

AU - Nissen, I.A.

AU - Hayes, W.

AU - Velasquez, L.M.

AU - Hoekstra, O.S.

AU - Boellaard, R.

PY - 2014

Y1 - 2014

U2 - 10.1371/journal.pone.0087167

DO - 10.1371/journal.pone.0087167

M3 - Article

VL - 9

JO - PLoS ONE

JF - PLoS ONE

SN - 1932-6203

IS - 1

M1 - e87167

ER -