Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm)

D.A.M. Heideman, F.B.J.M. Thunnissen, D. Kramer, M.W. Doeleman, E.F. Smit, P.E. Postmus, C.J.L.M. Meijer, P.J.F. Snijders

Research output: Contribution to journalMeeting AbstractOther research output

Original languageUndefined/Unknown
Pages (from-to)40-40
JournalAnnals of Oncology
Volume20
Publication statusPublished - 2009

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Heideman, D. A. M., Thunnissen, F. B. J. M., Kramer, D., Doeleman, M. W., Smit, E. F., Postmus, P. E., ... Snijders, P. J. F. (2009). Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm). Annals of Oncology, 20, 40-40.