Measurement system analysis for binary inspection: continuous versus dichotomous measurands

J. de Mast, T.P. Erdmann, W.N. van Wieringen

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)99-112
JournalJournal of quality technology
Volume43
Issue number2
Publication statusPublished - 2011

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