Measurement system analysis for binary inspection: continuous versus dichotomous measurands

J. de Mast, T.P. Erdmann, W.N. van Wieringen

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined/Unknown
Pages (from-to)	99-112
Journal	Journal of quality technology
Volume	43
Issue number	2
Publication status	Published - 2011

Cite this

@article{a6fbbb905d9a4fbd839a6331f77c089d,

title = "Measurement system analysis for binary inspection: continuous versus dichotomous measurands",

author = "{de Mast}, J. and T.P. Erdmann and {van Wieringen}, W.N.",

year = "2011",

language = "Undefined/Unknown",

volume = "43",

pages = "99--112",

journal = "Journal of quality technology ",

issn = "0022-4065",

publisher = "American Society for Quality",

number = "2",

}