Original language | Undefined/Unknown |
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Pages (from-to) | 99-112 |
Journal | Journal of quality technology |
Volume | 43 |
Issue number | 2 |
Publication status | Published - 2011 |
Measurement system analysis for binary inspection: continuous versus dichotomous measurands
J. de Mast, T.P. Erdmann, W.N. van Wieringen
Research output: Contribution to journal › Article › Academic › peer-review