| Original language | Undefined/Unknown |
|---|---|
| Pages (from-to) | 99-112 |
| Journal | Journal of quality technology |
| Volume | 43 |
| Issue number | 2 |
| Publication status | Published - 2011 |
Cite this
de Mast, J., Erdmann, T. P., & van Wieringen, W. N. (2011). Measurement system analysis for binary inspection: continuous versus dichotomous measurands. Journal of quality technology , 43(2), 99-112.
@article{a6fbbb905d9a4fbd839a6331f77c089d,
title = "Measurement system analysis for binary inspection: continuous versus dichotomous measurands",
author = "{de Mast}, J. and T.P. Erdmann and {van Wieringen}, W.N.",
year = "2011",
language = "Undefined/Unknown",
volume = "43",
pages = "99--112",
journal = "Journal of quality technology",
issn = "0022-4065",
publisher = "American Society for Quality",
number = "2",
}
de Mast, J, Erdmann, TP & van Wieringen, WN 2011, 'Measurement system analysis for binary inspection: continuous versus dichotomous measurands' Journal of quality technology , vol. 43, no. 2, pp. 99-112.
Measurement system analysis for binary inspection: continuous versus dichotomous measurands. / de Mast, J.; Erdmann, T.P.; van Wieringen, W.N.
In: Journal of quality technology , Vol. 43, No. 2, 2011, p. 99-112.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - Measurement system analysis for binary inspection: continuous versus dichotomous measurands
AU - de Mast, J.
AU - Erdmann, T.P.
AU - van Wieringen, W.N.
PY - 2011
Y1 - 2011
M3 - Article
VL - 43
SP - 99
EP - 112
JO - Journal of quality technology
JF - Journal of quality technology
SN - 0022-4065
IS - 2
ER -
de Mast J, Erdmann TP, van Wieringen WN. Measurement system analysis for binary inspection: continuous versus dichotomous measurands. Journal of quality technology . 2011;43(2):99-112.