Measurement system analysis for binary inspection: continuous versus dichotomous measurands

J. de Mast, T.P. Erdmann, W.N. van Wieringen

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)99-112
JournalJournal of quality technology
Volume43
Issue number2
Publication statusPublished - 2011

Cite this

@article{a6fbbb905d9a4fbd839a6331f77c089d,
title = "Measurement system analysis for binary inspection: continuous versus dichotomous measurands",
author = "{de Mast}, J. and T.P. Erdmann and {van Wieringen}, W.N.",
year = "2011",
language = "Undefined/Unknown",
volume = "43",
pages = "99--112",
journal = "Journal of quality technology",
issn = "0022-4065",
publisher = "American Society for Quality",
number = "2",

}

Measurement system analysis for binary inspection: continuous versus dichotomous measurands. / de Mast, J.; Erdmann, T.P.; van Wieringen, W.N.

In: Journal of quality technology , Vol. 43, No. 2, 2011, p. 99-112.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Measurement system analysis for binary inspection: continuous versus dichotomous measurands

AU - de Mast, J.

AU - Erdmann, T.P.

AU - van Wieringen, W.N.

PY - 2011

Y1 - 2011

M3 - Article

VL - 43

SP - 99

EP - 112

JO - Journal of quality technology

JF - Journal of quality technology

SN - 0022-4065

IS - 2

ER -