Performance characteristics of the high resolution research tomograph - Comparison of three prototypes

Hugo W.A.M. De Jong*, Christof Knoess, Adriaan A. Lammertsma, Mark Lenox, Stefan Vollmar, Mike Casey, Klaus Wienhard, Wolf Dieter Heiss, Ronald Boellaard

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The High Resolution Research Tomograph (HRRT) is the first PET scanner with depth of interaction (DOI) capability. Presently three different versions have been developed: one equipped with two 7.5 mm thick crystal layers (HRRT-DC), the second with only a single 7.5 mm crystal layer (HRRT-S) and the latest HRRT with two 10mm thick crystal layers (HRRT-D). In this study the performance of the new HRRT-D was assessed and compared with the other two HRRTs. The characteristics were measured according to the NEMA NU2 standards. Similar scatter fractions between all three scanners were observed. NEC rates of the HRRT-D were about 8 and 3 times higher than those of HRRT-S and HRRT-DC, respectively. However, spatial resolution of the new HRRT-D is somewhat lower than that of HRRT-DC and HRRT-S. Use of thicker crystals in the new HRRT-D improved the sensitivity and NECR performance significantly at the cost of only a small deterioration of the spatial resolution compared with the other HRRT designs.

Original languageEnglish
Title of host publicationvu medical center
Pages3437-3439
Number of pages3
Volume6
Publication statusPublished - 1 Dec 2004
Event2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors - Rome, Italy
Duration: 16 Oct 200422 Oct 2004

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors
CountryItaly
CityRome
Period16/10/200422/10/2004

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