Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome

R.P. Kuiper, L.E.L.M. Vissers, R. Venkatachalam, D. Bodmer, E. Hoenselaar, M. Goossens, A. Haufe, E. Kamping, R.C. Niessen, F.B.L. Hogervorst, J.J.P. Gille, B. Redeker, C.M.J. Tops, M.E. van Gijn, A.M.W. van den Ouweland, N. Rahner, V. Steinke, P. Kahl, E. Holinski-Feder, M. Morak & 15 others M. Kloor, S. Stemmler, B. Betz, P. Hutter, D.J. Bunyan, S. Syngal, J.O. Culver, T. Graham, T.L. Chan, I.D. Nagtegaal, J.H.J.M. van Krieken, H.K. Schackert, N. Hoogerbrugge, A.G. van Kessel, M.J.L. Ligtenberg

Research output: Contribution to journal › Article › Academic › peer-review

Original languageUndefined/Unknown
Pages (from-to)407-414
JournalHuman Mutation
Volume32
Issue number4
DOIs
Publication statusPublished - 2011

Cite this

Kuiper, R. P., Vissers, L. E. L. M., Venkatachalam, R., Bodmer, D., Hoenselaar, E., Goossens, M., ... Ligtenberg, M. J. L. (2011). Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome. Human Mutation, 32(4), 407-414. https://doi.org/10.1002/humu.21446
Kuiper, R.P. ; Vissers, L.E.L.M. ; Venkatachalam, R. ; Bodmer, D. ; Hoenselaar, E. ; Goossens, M. ; Haufe, A. ; Kamping, E. ; Niessen, R.C. ; Hogervorst, F.B.L. ; Gille, J.J.P. ; Redeker, B. ; Tops, C.M.J. ; van Gijn, M.E. ; van den Ouweland, A.M.W. ; Rahner, N. ; Steinke, V. ; Kahl, P. ; Holinski-Feder, E. ; Morak, M. ; Kloor, M. ; Stemmler, S. ; Betz, B. ; Hutter, P. ; Bunyan, D.J. ; Syngal, S. ; Culver, J.O. ; Graham, T. ; Chan, T.L. ; Nagtegaal, I.D. ; van Krieken, J.H.J.M. ; Schackert, H.K. ; Hoogerbrugge, N. ; van Kessel, A.G. ; Ligtenberg, M.J.L. / Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome. In: Human Mutation. 2011 ; Vol. 32, No. 4. pp. 407-414.
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title = "Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome",
author = "R.P. Kuiper and L.E.L.M. Vissers and R. Venkatachalam and D. Bodmer and E. Hoenselaar and M. Goossens and A. Haufe and E. Kamping and R.C. Niessen and F.B.L. Hogervorst and J.J.P. Gille and B. Redeker and C.M.J. Tops and {van Gijn}, M.E. and {van den Ouweland}, A.M.W. and N. Rahner and V. Steinke and P. Kahl and E. Holinski-Feder and M. Morak and M. Kloor and S. Stemmler and B. Betz and P. Hutter and D.J. Bunyan and S. Syngal and J.O. Culver and T. Graham and T.L. Chan and I.D. Nagtegaal and {van Krieken}, J.H.J.M. and H.K. Schackert and N. Hoogerbrugge and {van Kessel}, A.G. and M.J.L. Ligtenberg",
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volume = "32",
pages = "407--414",
journal = "Human Mutation",
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Kuiper, RP, Vissers, LELM, Venkatachalam, R, Bodmer, D, Hoenselaar, E, Goossens, M, Haufe, A, Kamping, E, Niessen, RC, Hogervorst, FBL, Gille, JJP, Redeker, B, Tops, CMJ, van Gijn, ME, van den Ouweland, AMW, Rahner, N, Steinke, V, Kahl, P, Holinski-Feder, E, Morak, M, Kloor, M, Stemmler, S, Betz, B, Hutter, P, Bunyan, DJ, Syngal, S, Culver, JO, Graham, T, Chan, TL, Nagtegaal, ID, van Krieken, JHJM, Schackert, HK, Hoogerbrugge, N, van Kessel, AG & Ligtenberg, MJL 2011, 'Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome' Human Mutation, vol. 32, no. 4, pp. 407-414. https://doi.org/10.1002/humu.21446

Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome. / Kuiper, R.P.; Vissers, L.E.L.M.; Venkatachalam, R.; Bodmer, D.; Hoenselaar, E.; Goossens, M.; Haufe, A.; Kamping, E.; Niessen, R.C.; Hogervorst, F.B.L.; Gille, J.J.P.; Redeker, B.; Tops, C.M.J.; van Gijn, M.E.; van den Ouweland, A.M.W.; Rahner, N.; Steinke, V.; Kahl, P.; Holinski-Feder, E.; Morak, M.; Kloor, M.; Stemmler, S.; Betz, B.; Hutter, P.; Bunyan, D.J.; Syngal, S.; Culver, J.O.; Graham, T.; Chan, T.L.; Nagtegaal, I.D.; van Krieken, J.H.J.M.; Schackert, H.K.; Hoogerbrugge, N.; van Kessel, A.G.; Ligtenberg, M.J.L.

In: Human Mutation, Vol. 32, No. 4, 2011, p. 407-414.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome

AU - Kuiper, R.P.

AU - Vissers, L.E.L.M.

AU - Venkatachalam, R.

AU - Bodmer, D.

AU - Hoenselaar, E.

AU - Goossens, M.

AU - Haufe, A.

AU - Kamping, E.

AU - Niessen, R.C.

AU - Hogervorst, F.B.L.

AU - Gille, J.J.P.

AU - Redeker, B.

AU - Tops, C.M.J.

AU - van Gijn, M.E.

AU - van den Ouweland, A.M.W.

AU - Rahner, N.

AU - Steinke, V.

AU - Kahl, P.

AU - Holinski-Feder, E.

AU - Morak, M.

AU - Kloor, M.

AU - Stemmler, S.

AU - Betz, B.

AU - Hutter, P.

AU - Bunyan, D.J.

AU - Syngal, S.

AU - Culver, J.O.

AU - Graham, T.

AU - Chan, T.L.

AU - Nagtegaal, I.D.

AU - van Krieken, J.H.J.M.

AU - Schackert, H.K.

AU - Hoogerbrugge, N.

AU - van Kessel, A.G.

AU - Ligtenberg, M.J.L.

PY - 2011

Y1 - 2011

U2 - 10.1002/humu.21446

DO - 10.1002/humu.21446

M3 - Article

VL - 32

SP - 407

EP - 414

JO - Human Mutation

JF - Human Mutation

SN - 1059-7794

IS - 4

ER -

Kuiper RP, Vissers LELM, Venkatachalam R, Bodmer D, Hoenselaar E, Goossens M et al. Recurrence and Variability of Germline EPCAM Deletions in Lynch Syndrome. Human Mutation. 2011;32(4):407-414. https://doi.org/10.1002/humu.21446

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